Jakatdar, S. : rechercher sur Z-Library

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1

Body-image thought processes: The development and initial validation of the Assessment of Body-Image Cognitive Distortions

Tejal A. Jakatdar, Thomas F. Cash, Erin K. Engle

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 176 KB

english, 2006

2

The Body Image Quality of Life Inventory: further validation with college men and women

Thomas F. Cash, Tejal A. Jakatdar, Emily Fleming Williams

Journal:

Année:

2004

Langue:

english

Fichier:

PDF, 101 KB

english, 2004

3

Thinking about social situations: The moderated effects of imposing structure

Thomas L. Rodebaugh, Tejal A. Jakatdar, Anna Rosenberg, Richard G. Heimberg

Journal:

Behaviour Research and Therapy

Année:

2009

Langue:

english

Fichier:

PDF, 176 KB

english, 2009

4

Specular spectroscopic scatterometry

Xinhui Niu,, Jakatdar, N., Junwei Bao,, Spanos, C.J.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Année:

2001

Langue:

english

Fichier:

PDF, 377 KB

english, 2001

5

Apparatus and method for speech recognition

Jakatdar, Priyadarshan

Journal:

The Journal of the Acoustical Society of America

Année:

1991

Langue:

english

Fichier:

PDF, 133 KB

english, 1991

6

XML-based visual specification of multidisciplinary applications

Ahmed Al-Theneyan, Amol Jakatdar, Piyush Mehrotra, Mohammad Zubair

Journal:

Future Generation Computer Systems

Année:

2002

Langue:

english

Fichier:

PDF, 445 KB

english, 2002

7

“To Avoid Evaluation, Withdraw”: Fears of Evaluation and Depressive Cognitions Lead to Social Anxiety and Submissive Withdrawal

Justin W. Weeks, Thomas L. Rodebaugh, Richard G. Heimberg, Peter J. Norton, Tejal A. Jakatdar

Journal:

Cognitive Therapy and Research

Année:

2009

Langue:

english

Fichier:

PDF, 338 KB

english, 2009

8

Optimal encoding of stationary Gaussian sources with applications in image coding (Ph.D. Thesis abstr.)

Journal:

IEEE Transactions on Information Theory

Année:

1983

Langue:

english

Fichier:

PDF, 130 KB

english, 1983

9

A transform tree code for stationary Gaussian sources

Pearlman, W., Jakatdar, P.

Journal:

IEEE Transactions on Information Theory

Année:

1985

Langue:

english

Fichier:

PDF, 1.23 MB

english, 1985

10

Educating the Next Generation of Mobile Game Developers

Zyda, M., Thukral, D., Jakatdar, S., Engelsma, J., Ferrans, J., Hans, M., Shi, L., Kitson, F., Venu Vasudevan

Journal:

IEEE Computer Graphics and Applications

Année:

2007

Langue:

english

Fichier:

PDF, 1.23 MB

english, 2007

11

The Effectiveness and Efficiency of Hybrid Transform/DPCM Interframe Image Coding

Pearlman, W., Jakatdar, P.

Journal:

IEEE Transactions on Communications

Année:

1984

Langue:

english

Fichier:

PDF, 1.01 MB

english, 1984

12

SPIE Proceedings [SPIE 23rd Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 22 February 1998)] Metrology, Inspection, and Process Control for Microlithography XII - Characterization of a positive chemically amplified photoresist for process control

Jakatdar, Nickhil H., Niu, Xinhui, Spanos, Costas J., Romano, Andrew R., Bendik, Joseph J., Kovacs, Ronald P., Hill, Stephen L., Singh, Bhanwar

Année:

1998

Langue:

english

Fichier:

PDF, 581 KB

english, 1998

13

Adaptive transform tree coding of images

Pearlman, W.A., Jakatdar, P., Leung, M.M.

Journal:

IEEE Journal on Selected Areas in Communications

Année:

1992

Langue:

english

Fichier:

PDF, 1.45 MB

english, 1992

14

SPIE Proceedings [SPIE Microlithography '99 - Santa Clara, CA (Sunday 14 March 1999)] Metrology, Inspection, and Process Control for Microlithography XIII - Parameter extraction framework for DUV lithography simulation

Jakatdar, Nickhil H., Bao, Junwei, Spanos, Costas J., Niu, Xinhui, Bendik, Joseph J., Hill, Stephen L., Singh, Bhanwar

Année:

1999

Langue:

english

Fichier:

PDF, 457 KB

english, 1999

15

SPIE Proceedings [SPIE 23rd Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 22 February 1998)] Metrology, Inspection, and Process Control for Microlithography XII - Characterization of a chemically amplified photoresist for simulation using a modified "poor man's DRM" methodology

Jakatdar, Nickhil H., Niu, Xinhui, Spanos, Costas J., Singh, Bhanwar

Année:

1998

Langue:

english

Fichier:

PDF, 348 KB

english, 1998

16

[IEEE Comput. Soc First IEEE/ACM International Symposium on Cluster Computing and the Grid - Brisbane, Qld., Australia (15-18 May 2001)] Proceedings First IEEE/ACM International Symposium on Cluster Computing and the Grid - XML-based visual specification of multidisciplinary applications

Al-Theyeyan, A., Jakatdar, A., Mohrotra, P., Zubair, M.

Année:

2001

Langue:

english

Fichier:

PDF, 1.09 MB

english, 2001

17

[IEEE 2007 IEEE Custom Integrated Circuits Conference - San Jose, CA, USA (2007.09.16-2007.09.19)] 2007 IEEE Custom Integrated Circuits Conference - Integration of CMP Modeling in RC Extraction and Timing Flow

Liao, Hongmei, Song, Li, Jakatdar, Nickhil, Radojcic, Riko

Année:

2007

Langue:

english

Fichier:

PDF, 345 KB

english, 2007

18

[IEEE 2007 International Symposium on Integrated Circuits - Singapore (2007.09.26-2007.09.28)] 2007 International Symposium on Integrated Circuits - CMP Model Based RC Extraction

Liao, Hongmei, Song, Li, Jakatdar, Nickhil, Radojcic, Riko

Année:

2007

Langue:

english

Fichier:

PDF, 2.22 MB

english, 2007

19

[Institute of Electrical and Electronics Engineers IEEE International Conference on Acoustics, Speech, and Signal Processing - San Diego, CA, USA (March 1984)] ICASSP '84. IEEE International Conference on Acoustics, Speech, and Signal Processing - An optimal transform tree coding method applied to images

Jakatdar, P., Pearlman, W.

Année:

1984

Langue:

english

Fichier:

PDF, 209 KB

english, 1984

20

SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II - Neural network approach to rapid thin film characterization

Jakatdar, Nickhil H., Niu, Xinhui, Spanos, Costas J., Stover, John C.

Année:

1998

Langue:

english

Fichier:

PDF, 1.27 MB

english, 1998

21

Osteosarcoma Phenotype Is Inhibited by 3,4-Methylenedioxy-β-nitrostyrene

Messerschmitt, Patrick J., Rettew, Ashley N., Schroeder, Nicholas O., Brookover, Robert E., Jakatdar, Avanti P., Getty, Patrick J., Greenfield, Edward M.

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 3.33 MB

english, 2012

22

SPIE Proceedings [SPIE Microlithography '99 - Santa Clara, CA (Sunday 14 March 1999)] Advances in Resist Technology and Processing XVI - Physical modeling of deprotection-induced thickness loss

Jakatdar, Nickhil H., Bao, Junwei, Spanos, Costas J., Subramanian, Ramkumar, Rangarajan, Bharath, Conley, Will

Année:

1999

Langue:

english

Fichier:

PDF, 299 KB

english, 1999

23

Validation of the Ambivalent and Purposeful Engagement – Trait Measure

Fernandez, Katya C., Langer, Julia K., Rodebaugh, Thomas L., Jakatdar, Tejal A., Heimberg, Richard G., Lenze, Eric J.

Journal:

Anxiety Stress & Coping

Année:

2014

Langue:

english

Fichier:

PDF, 180 KB

english, 2014

24

[Institute of Electrical and Electronics Engineers IEEE International Conference on Acoustics, Speech, and Signal Processing - Tampa, FL, USA (April 1985)] ICASSP '85. IEEE International Conference on Acoustics, Speech, and Signal Processing - Adaptive transform tree coding of images

Pearlman, W., Leung, M., Jakatdar, P.

Année:

1985

Langue:

english

Fichier:

PDF, 167 KB

english, 1985

25

SPIE Proceedings [SPIE 23rd Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 22 February 1998)] Metrology, Inspection, and Process Control for Microlithography XII - Optical thin-film decomposition for DUV positive-tone resist process monitoring

Niu, Xinhui, Jakatdar, Nickhil H., Spanos, Costas J., Bendik, Joseph J., Kovacs, Ronald P., Singh, Bhanwar

Année:

1998

Langue:

english

Fichier:

PDF, 305 KB

english, 1998

26

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Metrology, Inspection, and Process Control for Microlithography XIV - Specular spectral profilometry on metal layers

Bao, Junwei, Niu, Xinhui, Jakatdar, Nickhil H., Spanos, Costas J., Bendik, Joseph J., Sullivan, Neal T.

Année:

2000

Langue:

english

Fichier:

PDF, 1.76 MB

english, 2000

27

SPIE Proceedings [SPIE Microelectronic Manufacturing Technologies - Edinburgh, United Kingdom (Wednesday 19 May 1999)] Lithography for Semiconductor Manufacturing - Deep-ultraviolet lithography simulator tuning by resist profile matching

Niu, Xinhui, Jakatdar, Nickhil H., Spanos, Costas J., Mack, Chris A., Stevenson, Tom

Année:

1999

Langue:

english

Fichier:

PDF, 1.20 MB

english, 1999

28

SPIE Proceedings [SPIE Microelectronic Manufacturing Technologies - Edinburgh, United Kingdom (Wednesday 19 May 1999)] In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing - Physically based model for predicting volume shrinkage in chemically amplified resists

Jakatdar, Nickhil H., Bao, Junwei, Spanos, Costas J., Subramanian, Ramkumar, Rangarajan, Bharath, Romano, Andrew R., Amberiadis, Kostas, Kissinger, Gudrun, Okumura, Katsuya, Pabbisetty, Seshu, Weiland

Année:

1999

Langue:

english

Fichier:

PDF, 303 KB

english, 1999

29

SPIE Proceedings [SPIE Microlithography '99 - Santa Clara, CA (Sunday 14 March 1999)] Metrology, Inspection, and Process Control for Microlithography XIII - Specular spectroscopic scatterometry in DUV lithography

Niu, Xinhui, Jakatdar, Nickhil H., Bao, Junwei, Spanos, Costas J., Yedur, Sanjay K., Singh, Bhanwar

Année:

1999

Langue:

english

Fichier:

PDF, 1.46 MB

english, 1999

30

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Metrology, Inspection, and Process Control for Microlithography XVII - Optical digital profilometry applications on contact holes

Bischoff, Joerg, Niu, Xinhui, Jakatdar, Nickhil H., Herr, Daniel J.

Année:

2003

Langue:

english

Fichier:

PDF, 634 KB

english, 2003

31

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Metrology, Inspection, and Process Control for Microlithography XIV - Specular spectroscopic profilometry for the sub-0.18-um polySi-gate processes

Niu, Xinhui, Jakatdar, Nickhil H., Yedur, Sanjay K., Singh, Bhanwar, Sullivan, Neal T.

Année:

2000

Langue:

english

Fichier:

PDF, 1.02 MB

english, 2000

32

SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II - Novel DUV photoresist modeling by optical thin film decomposition from spectral ellipsometry/reflectometry data

Niu, Xinhui, Jakatdar, Nickhil H., Spanos, Costas J., Stover, John C.

Année:

1998

Langue:

english

Fichier:

PDF, 662 KB

english, 1998

33

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Metrology, Inspection, and Process Control for Microlithography XVIII - Characterization of integrated optical CD for process control

Yu, Jackie, Silver, Richard M., Uchida, Junichi, van Dommelen, Youri, Carpaij, Rene, Cheng, Shaunee, Pollentier, Ivan, Viswanathan, Anita, Lane, Lawrence, Barry, Kelly A., Jakatdar, Nickhil

Année:

2004

Langue:

english

Fichier:

PDF, 838 KB

english, 2004

34

SPIE Proceedings [SPIE 23rd Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 22 February 1998)] Metrology, Inspection, and Process Control for Microlithography XII - In-situ metrology for deep-ultraviolet lithography process control

Jakatdar, Nickhil H., Niu, Xinhui, Musacchio, John T., Spanos, Costas J., Singh, Bhanwar

Année:

1998

Langue:

english

Fichier:

PDF, 1.07 MB

english, 1998

35

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Metrology, Inspection, and Process Control for Microlithography XIV - Phase profilometry for the 193-nm lithography gate stack

Jakatdar, Nickhil H., Niu, Xinhui, Bao, Junwei, Spanos, Costas J., Yedur, Sanjay K., Deleporte, Alain G., Sullivan, Neal T.

Année:

2000

Langue:

english

Fichier:

PDF, 1005 KB

english, 2000

36

[ASCE CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY - Gaithersburg, Maryland (USA) (23-27 March 1998)] The 1998 international conference on characterization and metrology for ULSI technology - Novel metrology for the DUV photolithography sequence

Jakatdar, Nickhil, Niu, Xinhui, Zhang, Haolin, Bao, Junwei, Spanos, Costas

Année:

1998

Fichier:

PDF, 724 KB

1998